Course Instructor: Ion Bucur

Functional modeling. Types of simulation. Logical Fault Models. Fault equivalence and fault location. Fault dominance. Functional testing without fault models, exhaustive and pseudo-exhaustive testing, functional testing with specific fault models. Discrete Markov Chain Models and their application in random testing. Controllability and observability. Syndrome testing. Signature analysis. Ad hoc design for testability techniques.

Syllabus:

• Introduction.
• Modeling and Logic Simulation.
• Fault Modeling.
• Fault Simulation.
• Testing for Single Stuck Faults.
• Testing for Bridging Faults.
• Functional Testing.
• Design for Testability.
• Compression Techniques.
• Built-In Self Test (BIST).
• Logic-Level Diagnosis.
• Self-Checking Design.